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Test Accessories
By combining the latest in LED technology with the unmatched illuminating dynamics of prismatic glass, this High Bay LED luminaire brings a superior, incomparable proficiency and reliability to the table. With its remote driver capability, the TDK HBLED-540 High Bay LED Light Fixture is ideal for EMC chambers with minimal RF emissions.
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Extendible Test Leads
The Extendable Tip Probe permits testing in those hard to reach areas. The tips are fully insulated with durable Kynar. This prevents accidental shorting of adjacent components. The tip is stainless steel and is very sharp, allowing for penetration of conformal coatings. The rubber lead is 18 gauge, 48" long.
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Advanced Test Module
SYSTEM 8 (ATM)
The Advanced Test Module (ATM) is a solution designed for the test and diagnostics of all logic PCB assemblies, from single component testing in-circuit up to complete assembly functional checks.
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Flight Test Switches
Curtiss-Wright Defense Solutions
Our compact, deterministic flight test switches have been qualified to reliably deliver high-speed, real-time data with a wide temperature operation ranging from -40 to 85°C. Their rapid boot-up capability minimizes data loss from power outages, while their flexible forwarding and filtering configurations can send what is required to multiple destinations for real-time monitoring, recording, and transmission.
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Optical Test
Optical components such as micro-lenses, diffractive optical elements (DOE), meta optical elements (MOE) and micro lens arrays (MLA) are now largely used on consumer electronics and even more optical elements need to be integrated into smaller and smaller packages. Nowadays mass-production industries key to success lies in increasing the yield by means of strongly automatized testing machines, with statistical analysis.
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Kelvin Contact Test
C.C.P. Contact Probes Co., LTD.
We offer different tip types for low resistance testing.
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Test Software
Powerstar
What separates Intepro from all its competitors is our software, PowerStar. A hardware independent testing software, PowerStar combines LabVIEW-like test flexibility with a library of more than 100 standard drag and drop test routines that cuts development of test programs to a fraction of the time of our competitors.
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Test Case Management
qTest Manager
Automatically sync project requirements structures with test case structures.Link requirements to test cases and defects for complete tractability.Create, baseline and modify requirements with proper version control.Visualize testing progress with our custom dashboard.
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Headphone Test Fixture
AEC206
The Larson Davis Model AEC206 Binaural Test Fixture is the tool for testing supra-aural, circumaural, supra-concha, intraconcha, and insert-type headphones. Preassembled with IEC 60318-4 (711) occluded-ear simulators and TEDS compatible preamplifiers that provide electronic calibration information, the Model AEC206 is user-friendly and easy to learn. Additionally, calibration is a simple process—a custom adapter is included for the Model CAL250 acoustic calibrator or similar device.
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Multimedia Test Instrument
882EA-HDMI
The Teledyne LeCroy quantumdata 882EA-HDMI test instrument provides two (2) HDMI transmit (Output) ports and two (2) HDMI receive (Input) ports for testing both HDMI sources, sinks and repeater devices. The 882EA-HDMI instrument can optionally be equipped with the industry approved HDMI CEC and HDCP compliance test options as well.
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Stand-Alone Test Fixture
MA 2012/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 15,50 kg
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Vehicle Test Chambers
Our dynamometer chambers feature dependable mechanical refrigeration, superior air flow, and expansive control systems. Our dynamometer drive-in vehicle test chambers are designed to integrate directly with a dynamometer system, while simultaneously exposing vehicles to a wide variety of environmental conditions including temperature and/or humidity, rain, wind, and more. Our control systems allow for precise temperature and humidity testing while meeting your exact specifications.
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High Spectral Rate and High Dynamic Range Miniature Spectrometers
VS70-HSR & VS70-HDR
VS70 is a high performance compact fiber coupled spectrometer system covering wide spectral range of 200 to 1050 nm. This OEM optical module is built around Horiba’stype-IV Aberration-Corrected Flat-Field Holographic Ion-Etched concave grating and is specially designed to easily adapt to a large variety of detectors and electronic drivers. This system is fitted with a custom variable order-sorting filter to eliminate higher orders.
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Discrete Detectors
TRAL test station is a quasi-universal test station designed to measure parameters of discrete (or small linear array) infrared detectors sensitive in a wide spectral range from about 700nm to about 16 000 nm (NIR/SWIR/MWIR/ LWIR detectors or broadband non selective detectors). All main types of infrared detectors can be tested: photonic detectors: photovoltaic/photoreconductive, cooled/non-coooled, thermal detectors, pyroelectric detectors etc.
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Waterproof High Range Conductivity Pen
C66
The Milwaukee Conductivity Pen is designed for hydroponic and other growers to help you make sure that your plants are receiving the right amount of nutrient. Keep EC in your target range to help your achieve better results.
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Auto Range Bench-Type DMM
VC8145
1. Large LCD. High contrast. Wide visual angle LCD display. white backlight 2. Dual-display：Main display 80000，Vice-display 80000，analog bar 21 sect, unit,function symbol complete 3、50 kinds of measuring function，With basicly DCV、ACV、DCA、ACA、Ω、CAP、Hz、TEMP、diode and Continuity measuring function etc； 4、Frequency measuring can rearch 80MHz； 5、Standard function generator:18 kinds of frequency,1％─99％ Duty cycle,1800 pcs wave output； 6、Single analyzed:(AC+DC) measuring synchronous，(AC+Hz) measuring synchronous，(DC+dBm) measuring synchronous，(dBm+Hz) measuring synchronous，(Hz+Duty) measuring synchronous，(℃+℉) displaying synchronous；
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In-circuit Test
i3070
The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
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Test Management Software
Easy to use to minimal training. Our Test Management Software is powerful enough to accommodate all of your electrical and function testing requirements, whether testing a cable harness or fully equipped vehicle or aircraft.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test p...show more -
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Standard Test Finger
SMT-1
It with Protection against electric shock device. It according to IEC60335, IEC60884, IEC61032, IEC60529, IEC60065, IEC60035, IEC60950, EN60529, EN60950, GB4706, GB7000, GB9706, UL507, VDE0470, etc.
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Supported Test Systems
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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ICT Test Probes
C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Test Equipment
Test Devices has developed the world’s most precise, accurate and efficient test solutions because the company employs very experienced and accomplished scientists and engineers. For almost 40 years Test Devices has developed and advanced the science of centrifugal, vibratory and thermal stress testing and measurement of rotational components – critical solutions engineers need to evaluate integrity and validate component parts.
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Stand-Alone Test Fixture
MA 2013/D/H/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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Physical Test Equipment
When assessing a coating for suitability for a particular application the testing of the physical properties such as bendability, impact resistance, hardness, washability and abrasion resistance are all required to provide information for decision making. Testing of the pigments using fineness of grind gauges, determining the specific gravity of the coating using density cups, measuring the viscosity using viscosity cups or rotational viscometers and assessing the drying time all provide information for the coating technical data sheets.
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Test Sphere Probe
CX-500
Shenzhen Chuangxin Instruments Co., Ltd.
Test Sphere Probe This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish. TOP
